This is the first time in scanning thermal microscopy (SThM) that users will be able to measure during scanning even temperatures up to 700°C with high precision and nanometer resolution
(AppNano) Applied NanoStructures, Inc., the manufacturer of AFM probes from California, will present at the Nano Israel exhibition to be held on March 24-25 the new and unique module it developed for measuring temperatures and measuring thermal resistance combined with surface characterization using AFM (Atomic Force Microscope).
The design of the VertiSense Scanning Thermal Microscopy (SThM) Module allows simultaneous temperature mapping and thermal conductivity contrast along with tomographic imaging.
This is the first time in scanning thermal microscopy (SThM) that users will be able to measure during scanning even temperatures up to 700°C with high precision and nanometer resolution.
The VertiSense Thermal Imaging Module is suitable for use with most commercial AFM instruments.
Madsho Sahar, which represents AppNano in Israel, announced that Dr. Ami Chand from AppNano will be hosted and will speak at the conference about the module and its uses.
